V-700 Series

UV-Visible/NIR Spectrophotometers

With nearly sixty years experience in the design of spectrophotometers, JASCO offers a complete range of UV-Visible/NIR spectrophotometers. The V-700 series comprises of five distinct models covering the entire spectrum from the Far UV (187nm) right through to the NIR (3200nm). Each model has been designed to meet the exacting requirements of any analytical laboratory.

Specification	V-730	V-750	V-760	V-770	V-780
Optical system	Rowland off-circle arrangement Single monochromator Double beam type	Czerny-Turner mount Single monochromator Fully symmetrical double beam type	Czerny-Turner mount Double monochromator Fully symmetrical double beam type	Czerny-Turner mount Single monochromator Fully symmetrical double beam type	Czerny-Turner mount Single monochromator Fully symmetrical double beam type
Light source	Halogen lamp, deuterium lamp	Halogen lamp, deuterium lamp	Halogen lamp, deuterium lamp	Halogen lamp, deuterium lamp	Halogen lamp, deuterium lamp
Wavelength range	190 to 1,100 nm	190 to 900 nm	187 to 900 nm	190 to 2,700 nm (3,200 nm option)	190 to 1,600 nm
Wavelength accuracy	±0.2 nm (at 656.1 nm)	±0.2 nm (at 656.1 nm)	±0.1 nm (at 656.1 nm)	±0.3 nm (at 656.1 nm) ±1.5 nm (at 1,312.2 nm)	±0.3 nm (at 656.1 nm) ±1.0 nm (at 1,312.2 nm)
Wavelength repeatability	±0.1 nm	±0.05 nm	±0.05 nm	±0.05 nm (UV-Vis) ±0.2 nm (NIR)	±0.05 nm (UV-Vis) ±0.1 nm (NIR)
Spectral bandwidth (SBW)	1 nm	0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode)	0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode)	UV-Vis: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode) NIR: 0.4, 0.8, 1, 2, 4, 8, 20, 40 nm L8, L20, L40 nm (low stray light mode) M4, M8 nm (micro cell mode)	UV-Vis: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode) NIR: 0.2, 0.4, 0.5, 1, 2, 4, 10, 20 nm L4, L10, L20 nm (low stray light mode) M2, M4 nm (micro cell mode)
Stray light	1 % (198 nm, KCl 12 g/L aqueous solution) 0.02 % (220 nm, NaI 10 g/L aqueous solution) 0.02 % (340 nm, NaNO₂ 50 g/L aqueous solution) 0.02 % (370 nm, NaNO₂ 50 g/L aqueous solution) SBW: 1 nm	1 % (198 nm, KCl 12 g/L aqueous solution) 0.005 % (220 nm, NaI 10 g/L aqueous solution) 0.005 % (340 nm, NaNO₂ 50 g/L aqueous solution) 0.005 % (370 nm, NaNO₂ 50 g/L aqueous solution) SBW: L2 nm	1 % (198 nm, KCl 12 g/L aqueous solution) 0.00008 % (220 nm, NaI 10 g/L aqueous solution) 0.00008 % (340 nm, NaNO₂ 50 g/L aqueous solution) 0.00008 % (370 nm, NaNO₂ 50 g/L aqueous solution) SBW: L2 nm	1 % (198 nm, KCl) 0.005 % (220 nm, NaI) 0.005 % (340 nm, NaNO₂) 0.005 % (370 nm, NaNO₂) SBW: L2 nm 0.04 % (1,420 nm, H₂O) 0.1 % (1,690 nm, CH₂Br₂) SBW: L8 nm	1 % (198 nm, KCl 12 g/L aqueous solution) 0.005 % (220 nm, NaI 10 g/L aqueous solution) 0.005 % (340 nm, NaNO₂ 50 g/L aqueous solution) 0.005 % (370 nm, NaNO₂ 50 g/L aqueous solution) SBW: L2 nm 0.04 % (1,420 nm, H₂O) SBW: L4 nm
Photometric range	-3 to 3 Abs	-4 to 4 Abs	-4 to 6 Abs	UV-Vis: -4 to 4 Abs NIR: -3 to 3 Abs	UV-Vis: -4 to 4 Abs NIR: -3 to 3 Abs
Photometric accuracy	±0.0015 Abs (0 to 0.5 Abs) ±0.0025 Abs (0.5 to 1 Abs) ±0.3 %T Tested with NIST SRM 930D	±0.0015 Abs (0 to 0.5 Abs) ±0.0025 Abs (0.5 to 1 Abs) ±0.3 %T Tested with NIST SRM 930D	±0.0015 Abs (0 to 0.5 Abs) ±0.0025 Abs (0.5 to 1 Abs) ±0.3 %T Tested with NIST SRM 930D	±0.0015 Abs (0 to 0.5 Abs) ±0.0025 Abs (0.5 to 1 Abs) ±0.3 %T Tested with NIST SRM 930D	±0.0015 Abs (0 to 0.5 Abs) ±0.0025 Abs (0.5 to 1 Abs) ±0.3 %T Tested with NIST SRM 930D
Photometric repeatability	±0.0005 Abs (0 to 0.5 Abs) ±0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D	±0.0005 Abs (0 to 0.5 Abs) ±0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D	±0.0005 Abs (0 to 0.5 Abs) ±0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D	±0.0005 Abs (0 to 0.5 Abs) ±0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D	±0.0005 Abs (0 to 0.5 Abs) ±0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D
Scanning speed	10 to 8,000 nm/min	10 to 4,000 nm/min (8,000 nm/min in preview mode)	10 to 4,000 nm/min (8,000 nm/min in preview mode)	10 to 4,000 nm/min (8,000 nm/min in preview mode)	10 to 4,000 nm/min (8,000 nm/min in preview mode)
Slew speed	24,000 nm/min	12,000 nm/min	12,000 nm/min	UV-Vis: 12,000 nm/min NIR: 48,000 nm/min	UV-Vis: 12,000 nm/min NIR: 24,000 nm/min
RMS noise	0.00004 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 1 nm)	0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)	0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)	0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)	0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)
Baseline stability	0.0004 Abs/hour (more than one hour after turning on the source, with room temperature stabilised, wavelength: 250 nm, response: slow)	0.0003 Abs/hour (wavelength: 250 nm, response: slow, SBW: 2 nm)	0.0003 Abs/hour (wavelength: 250 nm, response: slow, SBW: 2 nm)	0.0003 Abs/hour (wavelength: 250 nm, response: slow, SBW: 2 nm)	0.0004 Abs/hour (wavelength: 250 nm, response: slow, SBW: 2 nm)
Baseline flatness	±0.0005 Abs (200 to 1,000 nm)	±0.0002 Abs (200 to 850 nm)	±0.0003 Abs (200 to 800 nm)	±0.0002 Abs (200 to 2,500 nm)	±0.0002 Abs (200 to 1,600 nm)
Detector	Silicon photodiode	Photomultiplier tube	Photomultiplier tube	Photomultiplier tube, Peltier cooled PbS	Photomultiplier tube, Peltier cooled InGaAs photodiode
Standard functions	IQ accessory, start button, analogue output	IQ accessory, start button, analogue output	IQ accessory, start button, analogue output	IQ accessory, start button, analogue output	IQ accessory, start button, analogue output
Standard programs	Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily maintenance, two wavelength time course measurement	Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily check, two wavelength time course measurement	Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily check, two wavelength time course measurement	Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily check, two wavelength time course measurement	Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily check, two wavelength time course measurement
Dimensions and weight	486 (W) x 441 (D) x 216 (H) mm, 15 kg	460 (W) x 602 (D) x 268 (H) mm, 27 kg	460 (W) x 602 (D) x 268 (H) mm, 29 kg	460 (W) x 602 (D) x 268 (H) mm, 29 kg	460 (W) x 602 (D) x 268 (H) mm, 29 kg
Power requirements	120 VA	150 VA	150 VA	150 VA	150 VA
Installation requirements	Room temperature: 15 to 30 °C, humidity: below 85 %	Room temperature: 15 to 30 °C, humidity: below 85 %	Room temperature: 15 to 30 °C, humidity: below 85 %	Room temperature: 15 to 30 °C, humidity: below 85 %	Room temperature: 15 to 30 °C, humidity: below 85 %

Specification

V-730

V-750

V-760

V-770

V-780

Optical system

Rowland off-circle arrangement
Single monochromator
Double beam type

Czerny-Turner mount
Single monochromator
Fully symmetrical double beam type

Czerny-Turner mount
Double monochromator
Fully symmetrical double beam type

Czerny-Turner mount
Single monochromator
Fully symmetrical double beam type

Light source

Halogen lamp, deuterium lamp

Wavelength range

190 to 1,100 nm

190 to 900 nm

187 to 900 nm

190 to 2,700 nm (3,200 nm option)

190 to 1,600 nm

Wavelength accuracy

±0.2 nm (at 656.1 nm)

±0.1 nm (at 656.1 nm)

±0.3 nm (at 656.1 nm)
±1.5 nm (at 1,312.2 nm)

±0.3 nm (at 656.1 nm)
±1.0 nm (at 1,312.2 nm)

Wavelength repeatability

±0.1 nm

±0.05 nm

±0.05 nm (UV-Vis)
±0.2 nm (NIR)

±0.05 nm (UV-Vis)
±0.1 nm (NIR)

Spectral bandwidth (SBW)

1 nm

0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)

UV-Vis: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
NIR: 0.4, 0.8, 1, 2, 4, 8, 20, 40 nm
L8, L20, L40 nm (low stray light mode)
M4, M8 nm (micro cell mode)

UV-Vis: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
NIR: 0.2, 0.4, 0.5, 1, 2, 4, 10, 20 nm
L4, L10, L20 nm (low stray light mode)
M2, M4 nm (micro cell mode)

Stray light

1 % (198 nm, KCl 12 g/L aqueous solution)
0.02 % (220 nm, NaI 10 g/L aqueous solution)
0.02 % (340 nm, NaNO₂ 50 g/L aqueous solution)
0.02 % (370 nm, NaNO₂ 50 g/L aqueous solution)
SBW: 1 nm

1 % (198 nm, KCl 12 g/L aqueous solution)
0.005 % (220 nm, NaI 10 g/L aqueous solution)
0.005 % (340 nm, NaNO₂ 50 g/L aqueous solution)
0.005 % (370 nm, NaNO₂ 50 g/L aqueous solution)
SBW: L2 nm

1 % (198 nm, KCl 12 g/L aqueous solution)
0.00008 % (220 nm, NaI 10 g/L aqueous solution)
0.00008 % (340 nm, NaNO₂ 50 g/L aqueous solution)
0.00008 % (370 nm, NaNO₂ 50 g/L aqueous solution)
SBW: L2 nm

1 % (198 nm, KCl)
0.005 % (220 nm, NaI)
0.005 % (340 nm, NaNO₂)
0.005 % (370 nm, NaNO₂)
SBW: L2 nm
0.04 % (1,420 nm, H₂O)
0.1 % (1,690 nm, CH₂Br₂)
SBW: L8 nm

1 % (198 nm, KCl 12 g/L aqueous solution)
0.005 % (220 nm, NaI 10 g/L aqueous solution)
0.005 % (340 nm, NaNO₂ 50 g/L aqueous solution)
0.005 % (370 nm, NaNO₂ 50 g/L aqueous solution)
SBW: L2 nm
0.04 % (1,420 nm, H₂O)
SBW: L4 nm

Photometric range

-3 to 3 Abs

-4 to 4 Abs

-4 to 6 Abs

UV-Vis: -4 to 4 Abs
NIR: -3 to 3 Abs

Photometric accuracy

±0.0015 Abs (0 to 0.5 Abs)
±0.0025 Abs (0.5 to 1 Abs)
±0.3 %T
Tested with NIST SRM 930D

Photometric repeatability

±0.0005 Abs (0 to 0.5 Abs)
±0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D

Scanning speed

10 to 8,000 nm/min

10 to 4,000 nm/min (8,000 nm/min in preview mode)

Slew speed

24,000 nm/min

12,000 nm/min

UV-Vis: 12,000 nm/min
NIR: 48,000 nm/min

UV-Vis: 12,000 nm/min
NIR: 24,000 nm/min

RMS noise

0.00004 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 1 nm)

0.00003 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)

Baseline stability

0.0004 Abs/hour
(more than one hour after turning on the source, with room temperature stabilised, wavelength: 250 nm, response: slow)

0.0003 Abs/hour
(wavelength: 250 nm, response: slow, SBW: 2 nm)

0.0004 Abs/hour
(wavelength: 250 nm, response: slow, SBW: 2 nm)

Baseline flatness

±0.0005 Abs (200 to 1,000 nm)

±0.0002 Abs (200 to 850 nm)

±0.0003 Abs (200 to 800 nm)

±0.0002 Abs (200 to 2,500 nm)

±0.0002 Abs (200 to 1,600 nm)

Detector

Silicon photodiode

Photomultiplier tube

Photomultiplier tube, Peltier cooled PbS

Photomultiplier tube, Peltier cooled InGaAs photodiode

Standard functions

IQ accessory, start button, analogue output

Standard programs

Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily maintenance, two wavelength time course measurement

Abs/%T meter, quantitative analysis, spectrum measurement, time course measurement, fixed wavelength measurement, validation, daily check, two wavelength time course measurement

Dimensions and weight

486 (W) x 441 (D) x 216 (H) mm, 15 kg

460 (W) x 602 (D) x 268 (H) mm, 27 kg

460 (W) x 602 (D) x 268 (H) mm, 29 kg

Power requirements

120 VA

150 VA

Installation requirements

Room temperature: 15 to 30 °C, humidity: below 85 %

V-700 Series

UV-Visible/NIR Spectrophotometers

V-700 Series Specifications

Specifications

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